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Test Sets

a group of elements used in concert to perform a test.

See Also: Relay Test Sets


Showing results: 196 - 210 of 221 items found.

  • Pneumatically Powered Bed of Nails Testers

    Automator Pneumatic Family - Test Electronics

    Designed to provide factory assembly line conveyor based pneumatically actuated full test automation. Interchangeable pneumatics and manual lever options provide operation as a fully automated tester or as a manual bench top tester. These functional interchangeable options allow this fixture to grow with you as your production volumes increase. Test plate changeover is a quick 2 minute job. 4 thumbscrews to change the bottom plate and 4 SHC screws to change the top plate. The top plate drops down and slides out with the connector assembly. The bottom plate lifts up and out. The new plates slide back in. All rear panel connectors are mounted to the aluminum bracket on the top plate. This whole top plate assembly slides out together eliminating wiring hassles. Double sided access plate sets use transfer pins to get the signals from the bottom plate up to the top plate.

  • Lever Handle Bed of Nails Testers

    Automator Manual Family - Test Electronics

    Designed to provide factory assembly line conveyor based pneumatically actuated full test automation. Interchangeable pneumatics and manual lever options provide operation as a fully automated tester or as a manual bench top tester. These functional interchangeable options allow this fixture to grow with you as your production volumes increase. Test plate changeover is a quick 2 minute job. 4 thumbscrews to change the bottom plate and 4 SHC screws to change the top plate. The top plate drops down and slides out with the connector assembly. The bottom plate lifts up and out. The new plates slide back in. All rear panel connectors are mounted to the aluminum bracket on the top plate. This whole top plate assembly slides out together eliminating wiring hassles. Double sided access plate sets use transfer pins to get the signals from the bottom plate up to the top plate.

  • Digital I/O with Per Channel Timing, Programmable Logic Levels and PMU PXI Card

    GX5296 - Terotest Systems Ltd.

    The GX5296 offers the most performance and features of any 3U PXI dynamic digital I/O board on the market today. The 32-channel, GX5296 offers timing per pin, multiple time sets, data formatting, and an advanced sequencer – providing users with the capability emulate and test complex digital busses for system, board or device test applications. Offering 1 ns edge placement resolution per pin and a PMU per pin, the GX5296 has the ability to perform both DC and AC parametric testing. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level).

  • Sync Generator

    LT 4610 - Leader Electronics Corp.

    The LT 4610 is 1RU full-rack size sync signal generator that can output triple-rate SDI (3G-SDI/HD-SDI/SD-SDI) signals. It employs two power supply units for redundant operation to protect against power supply failures. The genlock function for external sync signals enables SDI signals, six sets of analog black burst sync signals, and audio word-clock signals to be output synchronously. The genlock function is equipped with a STAY IN SYNC function that maintains the phase when errors occur in the input signal, making it possible to provide stable sync systems.In addition to test pattern output including color bars and SDI check fields, the LT 4610 can embed ID characters, QVGA logo marks, safety area markers, and embedded audio in a SDI signal output.

  • 12 Channels 1.0 ~ 17.0 Gb/s (200Gbps) Pulse Pattern Generator and Error Detector

    CA9806-12 - UC Instruments, Corp.

    The UC INSTRUEMNTS CA9806-12 is a highp erformance, flexible 12 channels Pulse Pattern Generator and Error Detector that can operate from 1.0 to 17.0 Gb/s (200 G). It is combined with three sets CA9806 4 CH 1.0 to 17.0 Gbps Pulse Pattern Generator and Error Detector that incorporates an external one by 4 rate clock synthesizer. Its small size allows it to be placed close to the device under test, it can also be placed further away using the TX driver pre and post emphasis controls features to compensate for cable and interconnect losses. It also has a non destructive, integrated eye outline capture feature along with a quick eye height and width measurement capability. Build-in 8.5 ~ 15 Gb/s eye diagram testing function.

  • Dynamic Digital I/O With Per Channel Timing, Programmable Logic Levels And PMU PXI Card

    GX5296 - Marvin Test Solutions, Inc.

    The GX5296 offers advanced dynamic digital I/O performance and capabilities in a single slot, 3U PXI format. The 32-channel, GX5296 features timing per pin, multiple time sets, data formatting, and an advanced sequencer – providing users with the capability to emulate and test complex digital busses for system, board or device test applications. Offering sub-nanosecond edge placement resolution per pin and a PMU per pin, the GX5296 has the ability to perform both DC and AC parametric testing. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).

  • Multi-IDE Bundle

    NI

    The Multi-IDE Bundle provides a LabVIEW and C solution to build applications using multiple development environments. The bundle includes LabVIEW Professional Development System, LabWindows/CVI Full Development System, and Measurement Studio Enterprise Edition. LabVIEW NXG 1.0 the next generation of LabVIEW is included with your purchase of the Multi-IDE Bundle. It minimizes time to measurement with your data acquisition devices and benchtop instruments with engineering workflows for acquiring and visualizing data sets - programming optional. When needed, you can transition to a development approach to customize your test and measurement system.

  • Programmable Low-Ohm Meter

    DU5210/5211 - Delta United Instrument Co., Ltd.

    20m ~ 2Mtest range, 0.1% accuracy Provided Level and Pulse measurement modes, can be lower temperature influence in Pulse Mode Provided HI/LOW limit and BIN Sorting comparator function, to meet your needed 100 sets of memory, can be saved test parameter and comparator setting, easy to use. Auto Calibration Program Function, to easier your calibration procedure. (Specificity calibrator needed) Cover up free, system firmware upgrade can be update via RS-232, easy to maintenance High speed FADC, max. test speed up to 80 meas./sec, faster your automation equipment 240*64 Graphic LCD display, can be read the reading clearly and easier. User friendly programmable interface, easy to use Provided RS-232C and Handler combinatorial interface option, to meet your needed

  • USB Controlled RF Signal Generators

    Windfreak Technologies, llc

    Windfreak Technologies provides high value radio frequency devices such as RF Signal Generators, RF Synthesizers, RF Network Analyzers, RF Power Detectors, RF Mixers, and RF Frequency Converters. These devices can be used as RF Test and Measurement Equipment and controlled by Labview in an Automated Test Equipment (ATE) setup, or used as bolt-in RF modules in RF communications equipment. All products have innovative, powerful feature sets controlled by internal microprocessors so any settings can be memorized and used with or without a PC. Windfreak hardware also comes with the Labview GUI source code saving the end user hundreds of hours programming custom software.  Use one of our RF Signal Generators or other products risk free.  Return it if you dont like it.

  • Large-size Hybrid Reverberation / Anechoic Chamber

    F-Series - Emite Ingeniería SL. Ed

    The F large-size hybrid Reverberation/Anechoic Chamber represents the most versatile OTA test system in the market today. With the same unique test features of their E Series RC counterparts, the F-Series can also test large form-factor devices under test (DUTs) like laptops, large TV sets, solar and trash compactors, drones, fridges or washing and vending machines, among others. With up to 16x16, 8DLCC and DUTs up to 2m and 500 kg including full-body phantoms in a turntable, the F Series also expands the frequency range down to cover 200 MHz up to 40 GHz frequency ranges and the test modes to include EMC, BS, small cell, eNodeB and Virtual Drive Testing over the air (VDT-OTA). In an again unheard-of feature, the F-Series is also reverse-convertible into an Anechoic chamber, allowing Far Field (FF) and Spherical Near Field (SNF) radiation patterns, efficiency and gain measurements and pre-5G testing of antennas and devices. Conversion from RC to AC or vice versa can be performed within half a day.

  • USAF Targets

    Applied Image, Inc.

    These targets conform to MIL-STD-150A. Frequencies change by the 6th root of 2. This target is also available in custom sizes and contrasts. This test target meets requirements as specified in MIL-STD-150A for resolving power tests. The target consists of a series of Elements having two sets of lines at right angles. Each set of lines consists of three lines separated by spaces equal to the line width. Each bar has a length to width ratio of 5:1. (Line width is equal to one half of line pitch, which is the inverse of line frequency.) Elements are arranged in groups of six each and Groups are arranged in pairs. Even numbered Groups occupy the left side and bottom right corner and contain a square feature having and edge length equal to the line length of Element 2 in that group. Odd numbered Groups occupy the top right corner and side. Groups and Elements are labeled and differentiated by numbering adjacent to their features. Frequencies in cycles/mm (c/mm) increase between each Element by the sixth root of two (approximately 12.25% per step). The general formula for the line frequency of any target Element can be expressed as 2Group+(Element-1)/6.

  • Pro Model Automotive Meter W/PC Interface

    595 - Electronic Specialties Inc.

    The #595 is a premier automotive diagnostic tool. It is equipped with the latest testing capabilities, including Milliseconds Pulse Width, for measuring the on-time of fuel injectors. The #595 features a huge LCD display w/bargraph for easy viewing. This meter can even be interfaced to your PC or notebook computer for enhanced diagnostics and data presentation. The software and computer interface cable are included free! The #595 includes two sets of test leads, RPM pick-up, temperature probe, software CD, interface cable, protective holster, 9 volt battery, instructions manual and hard storage case. Inductive RPM pick-up features a five position, adjustable sensitivity switch.

  • Sub-systems

    Ducommun Inc

    Our self-contained, in-house components design and fabrication capacities ensure the breadth of sub-assemblies offered from rapid prototyping and proof of concept to full production. Ducommun has produced many high performance millimeterwave band sub-assemblies for commercial and military system applications. Among them, the K and Ka band directional Doppler Radar front ends are in production. Several hundreds of sets have been delivered. In addition, Ducommun has delivered Ka through W band engineering prototypes for plasma detection system, automotive Radar, speed Radar, automatic test set, radio telescope, missile terminal guidance, telecommunication system etc. applications.

  • Primary Current Injection Sets

    R.R.Transformers & Equipments

    Protective devices such as relays, overload Coils, Circuit breakers and CTS etc. must be checked regularly to ensure that they are always ready to operate correctly, Routine current injection testing will quickly detect faulty or incorrectly adjusted protection circuits / devices & will be possible to prevent serious damage to the system. Primary injection kit is designed to operate on single phase 230/240 volts AC 50 HZ to develop smooth & continuous test current as for loading, calibrating, and testing of CTS, Bimetal Relays, Protection Relays etc. The test set gives high current output at low cost and with inherent safety. The primary current injection testing checks all parts of the protection system by injecting current down the cable / bus bars. The application of the primary current injection sets is to ascertain the current carrying capacity of any Conductor, insulator, connector or calibration of CTS / Bi-metallic relays etc.

  • ARINC 664 ProView Software

    ProView - Innovative Control Systems, Inc.

    ProView is a low cost, ARINC 664 bus reader / logger / analyzer designed specifically for the Rockwell-Collins specific ARINC 664 implementation that works well, is very low cost, and no external capture hardware is required. Innovative Control Systems, Inc. is pleased to announce the release of our new ARINC 664 ProView logging analyzer software which allows you to perform live display, recording, playback, and Export (to CSV file) of Rockwell Collins specific ARINC 664 data on a suitable Microsoft® Windows® operating system based laptop or PC. No additional capture hardware is required for this analyzer, just an available Ethernet port on the computer and you are able to analyze your data. The software can also be used to create configuration files for our FTSIU flight test data acquisition interfaces as well as playback flight test data sets recorded by that equipment.

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